Applying machine learning to enhance runway safety through runway excursion risk mitigation

Edwin V. Odisho; Dothang Truong

doi:10.1109/ICNS52807.2021.9441554

Applying machine learning to enhance runway safety through runway excursion risk mitigation

Embry-Riddle Aeronautical University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	2021 Integrated Communications Navigation and Surveillance Conference, ICNS 2021
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781665435840
DOIs	https://doi.org/10.1109/ICNS52807.2021.9441554
State	Published - Apr 20 2021
Externally published	Yes
Event	2021 Integrated Communications Navigation and Surveillance Conference, ICNS 2021 - Dulles, United States Duration: Apr 19 2021 → Apr 23 2021

Publication series

Name	Integrated Communications, Navigation and Surveillance Conference, ICNS
Volume	2021-April
ISSN (Print)	2155-4943
ISSN (Electronic)	2155-4951

Conference

Conference	2021 Integrated Communications Navigation and Surveillance Conference, ICNS 2021
Country/Territory	United States
City	Dulles
Period	4/19/21 → 4/23/21

ASJC Scopus Subject Areas

Computer Graphics and Computer-Aided Design
Computer Vision and Pattern Recognition
Human-Computer Interaction

Access to Document

10.1109/ICNS52807.2021.9441554

Cite this

Odisho, E. V., & Truong, D. (2021). Applying machine learning to enhance runway safety through runway excursion risk mitigation. In 2021 Integrated Communications Navigation and Surveillance Conference, ICNS 2021 Article 9441554 (Integrated Communications, Navigation and Surveillance Conference, ICNS; Vol. 2021-April). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICNS52807.2021.9441554

Applying machine learning to enhance runway safety through runway excursion risk mitigation. / Odisho, Edwin V.; Truong, Dothang.
2021 Integrated Communications Navigation and Surveillance Conference, ICNS 2021. Institute of Electrical and Electronics Engineers Inc., 2021. 9441554 (Integrated Communications, Navigation and Surveillance Conference, ICNS; Vol. 2021-April).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Odisho, EV & Truong, D 2021, Applying machine learning to enhance runway safety through runway excursion risk mitigation. in 2021 Integrated Communications Navigation and Surveillance Conference, ICNS 2021., 9441554, Integrated Communications, Navigation and Surveillance Conference, ICNS, vol. 2021-April, Institute of Electrical and Electronics Engineers Inc., 2021 Integrated Communications Navigation and Surveillance Conference, ICNS 2021, Dulles, United States, 4/19/21. https://doi.org/10.1109/ICNS52807.2021.9441554

Odisho EV, Truong D. Applying machine learning to enhance runway safety through runway excursion risk mitigation. In 2021 Integrated Communications Navigation and Surveillance Conference, ICNS 2021. Institute of Electrical and Electronics Engineers Inc. 2021. 9441554. (Integrated Communications, Navigation and Surveillance Conference, ICNS). doi: 10.1109/ICNS52807.2021.9441554

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title = "Applying machine learning to enhance runway safety through runway excursion risk mitigation",

author = "Odisho, {Edwin V.} and Dothang Truong",

note = "Publisher Copyright: {\textcopyright} 2021 IEEE.; 2021 Integrated Communications Navigation and Surveillance Conference, ICNS 2021 ; Conference date: 19-04-2021 Through 23-04-2021",

year = "2021",

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T2 - 2021 Integrated Communications Navigation and Surveillance Conference, ICNS 2021

Y2 - 19 April 2021 through 23 April 2021

ER -

Applying machine learning to enhance runway safety through runway excursion risk mitigation

Publication series

Conference

ASJC Scopus Subject Areas

Access to Document

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Cite this