Dynamics of small amplitude, off-resonance AFM

Peter M. Hoffmann

doi:10.1016/S0169-4332(02)01494-0

Dynamics of small amplitude, off-resonance AFM

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Abstract

Most current non-contact-atomic force microscopy (nc-AFM) techniques rely on vibrating the measuring lever at resonance using amplitudes that are large compared to typical interaction length scales. Here we present results of simulations that show that off-resonance, small amplitude AFM provides an alternative non-contact technique in which force gradients can be measured directly without the need of mathematical de-convolution. We show that under a wide range of reasonable conditions the measurements are linear and quantitative.

Original language	American English
Journal	Applied Surface Science
DOIs	https://doi.org/10.1016/S0169-4332(02)01494-0
State	Published - 2003

Disciplines

Physical Sciences and Mathematics

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title = "Dynamics of small amplitude, off-resonance AFM",

abstract = " Most current non-contact-atomic force microscopy (nc-AFM) techniques rely on vibrating the measuring lever at resonance using amplitudes that are large compared to typical interaction length scales. Here we present results of simulations that show that off-resonance, small amplitude AFM provides an alternative non-contact technique in which force gradients can be measured directly without the need of mathematical de-convolution. We show that under a wide range of reasonable conditions the measurements are linear and quantitative. ",

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note = "Most current non-contact-atomic force microscopy (nc-AFM) techniques rely on vibrating the measuring lever at resonance using amplitudes that are large compared to typical interaction length scales. Here we present results of simulations that show that off-resonance, small amplitude AFM provides an alternative non-contact technique in which force gradients can be measured directly without the need of mathematical de-convolution.",

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journal = "Applied Surface Science",

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AU - Hoffmann, Peter M.

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PY - 2003

Y1 - 2003

N2 - Most current non-contact-atomic force microscopy (nc-AFM) techniques rely on vibrating the measuring lever at resonance using amplitudes that are large compared to typical interaction length scales. Here we present results of simulations that show that off-resonance, small amplitude AFM provides an alternative non-contact technique in which force gradients can be measured directly without the need of mathematical de-convolution. We show that under a wide range of reasonable conditions the measurements are linear and quantitative.

AB - Most current non-contact-atomic force microscopy (nc-AFM) techniques rely on vibrating the measuring lever at resonance using amplitudes that are large compared to typical interaction length scales. Here we present results of simulations that show that off-resonance, small amplitude AFM provides an alternative non-contact technique in which force gradients can be measured directly without the need of mathematical de-convolution. We show that under a wide range of reasonable conditions the measurements are linear and quantitative.

UR - https://www.sciencedirect.com/science/article/pii/S0169433202014940

U2 - 10.1016/S0169-4332(02)01494-0

DO - 10.1016/S0169-4332(02)01494-0

M3 - Article

JO - Applied Surface Science

JF - Applied Surface Science

ER -

Dynamics of small amplitude, off-resonance AFM

Abstract

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