Linear measurements of nanomechanical phenomena using small-amplitude AFM

Peter M. Hoffmann; Shivprasad Patil; George Matei; Atay Tanulku; Ralph Grimble; Özgur Özer; Steve Jeffery; Ahmet Oral; John Pethica

doi:10.1557/proc-838-o1.8

Linear measurements of nanomechanical phenomena using small-amplitude AFM

Peter M. Hoffmann, Shivprasad Patil, George Matei, Atay Tanulku, Ralph Grimble, Özgur Özer, Steve Jeffery, Ahmet Oral, John Pethica

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials
Publisher	Materials Research Society
Pages	7-12
Number of pages	6
ISBN (Print)	1558997865, 9781558997868
DOIs	https://doi.org/10.1557/proc-838-o1.8
State	Published - 2004
Externally published	Yes
Event	2004 MRS Fall Meeting - Boston, MA, United States Duration: Nov 29 2004 → Dec 3 2004

Publication series

Name	Materials Research Society Symposium Proceedings
Volume	838
ISSN (Print)	0272-9172

Conference

Conference	2004 MRS Fall Meeting
Country/Territory	United States
City	Boston, MA
Period	11/29/04 → 12/3/04

ASJC Scopus Subject Areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Access to Document

10.1557/proc-838-o1.8

Cite this

Hoffmann, P. M., Patil, S., Matei, G., Tanulku, A., Grimble, R., Özer, Ö., Jeffery, S., Oral, A., & Pethica, J. (2004). Linear measurements of nanomechanical phenomena using small-amplitude AFM. In Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials (pp. 7-12). (Materials Research Society Symposium Proceedings; Vol. 838). Materials Research Society. https://doi.org/10.1557/proc-838-o1.8

Linear measurements of nanomechanical phenomena using small-amplitude AFM. / Hoffmann, Peter M.; Patil, Shivprasad; Matei, George et al.
Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials. Materials Research Society, 2004. p. 7-12 (Materials Research Society Symposium Proceedings; Vol. 838).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Hoffmann, PM, Patil, S, Matei, G, Tanulku, A, Grimble, R, Özer, Ö, Jeffery, S, Oral, A & Pethica, J 2004, Linear measurements of nanomechanical phenomena using small-amplitude AFM. in Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials. Materials Research Society Symposium Proceedings, vol. 838, Materials Research Society, pp. 7-12, 2004 MRS Fall Meeting, Boston, MA, United States, 11/29/04. https://doi.org/10.1557/proc-838-o1.8

@inproceedings{f3ac429f1e1d438e8c21a3ead6e85025,

title = "Linear measurements of nanomechanical phenomena using small-amplitude AFM",

author = "Hoffmann, {Peter M.} and Shivprasad Patil and George Matei and Atay Tanulku and Ralph Grimble and {\"O}zgur {\"O}zer and Steve Jeffery and Ahmet Oral and John Pethica",

year = "2004",

doi = "10.1557/proc-838-o1.8",

language = "English",

isbn = "1558997865",

series = "Materials Research Society Symposium Proceedings",

publisher = "Materials Research Society",

pages = "7--12",

booktitle = "Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials",

note = "2004 MRS Fall Meeting ; Conference date: 29-11-2004 Through 03-12-2004",

}

TY - GEN

T1 - Linear measurements of nanomechanical phenomena using small-amplitude AFM

AU - Hoffmann, Peter M.

AU - Patil, Shivprasad

AU - Matei, George

AU - Tanulku, Atay

AU - Grimble, Ralph

AU - Özer, Özgur

AU - Jeffery, Steve

AU - Oral, Ahmet

AU - Pethica, John

PY - 2004

Y1 - 2004

UR - http://www.scopus.com/inward/record.url?scp=34249872470&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=34249872470&partnerID=8YFLogxK

U2 - 10.1557/proc-838-o1.8

DO - 10.1557/proc-838-o1.8

M3 - Conference contribution

AN - SCOPUS:34249872470

SN - 1558997865

SN - 9781558997868

T3 - Materials Research Society Symposium Proceedings

SP - 7

EP - 12

BT - Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials

PB - Materials Research Society

T2 - 2004 MRS Fall Meeting

Y2 - 29 November 2004 through 3 December 2004

ER -

Linear measurements of nanomechanical phenomena using small-amplitude AFM

Publication series

Conference

ASJC Scopus Subject Areas

Access to Document

Other files and links

Cite this