Microelectronic Technology, AI and Academic Dishonesty: An Agile Engineering Approach

Tyler Thomas Procko; Omar Ochoa; Christina Frederick

Microelectronic Technology, AI and Academic Dishonesty: An Agile Engineering Approach

Tyler Thomas Procko, Omar Ochoa, Christina Frederick

Embry-Riddle Aeronautical University

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Journal	ASEE Annual Conference and Exposition, Conference Proceedings
State	Published - Jun 25 2023
Externally published	Yes
Event	2023 ASEE Annual Conference and Exposition - The Harbor of Engineering: Education for 130 Years, ASEE 2023 - Baltimore, United States Duration: Jun 25 2023 → Jun 28 2023

ASJC Scopus Subject Areas

General Engineering

Cite this

@article{aa8c4c3dd2244766a692e6a811333608,

title = "Microelectronic Technology, AI and Academic Dishonesty: An Agile Engineering Approach",

author = "Procko, {Tyler Thomas} and Omar Ochoa and Christina Frederick",

note = "Publisher Copyright: {\textcopyright} American Society for Engineering Education, 2023.; 2023 ASEE Annual Conference and Exposition - The Harbor of Engineering: Education for 130 Years, ASEE 2023 ; Conference date: 25-06-2023 Through 28-06-2023",

year = "2023",

month = jun,

day = "25",

language = "English",

journal = "ASEE Annual Conference and Exposition, Conference Proceedings",

issn = "2153-5965",

}

TY - JOUR

T1 - Microelectronic Technology, AI and Academic Dishonesty

T2 - 2023 ASEE Annual Conference and Exposition - The Harbor of Engineering: Education for 130 Years, ASEE 2023

AU - Procko, Tyler Thomas

AU - Ochoa, Omar

AU - Frederick, Christina

PY - 2023/6/25

Y1 - 2023/6/25

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M3 - Conference article

AN - SCOPUS:85172140049

SN - 2153-5965

JO - ASEE Annual Conference and Exposition, Conference Proceedings

JF - ASEE Annual Conference and Exposition, Conference Proceedings

Y2 - 25 June 2023 through 28 June 2023

ER -

Microelectronic Technology, AI and Academic Dishonesty: An Agile Engineering Approach

ASJC Scopus Subject Areas

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Cite this