TY - JOUR
T1 - Probability model of the exponentially rising transient response of a failed RC circuit
AU - Farooq-i-Azam, Muhammad
AU - Farooq, Muhammad Omar
N1 - Publisher Copyright:
© 2022 Elsevier Ltd
PY - 2022/12
Y1 - 2022/12
KW - Analysis of failed circuit
KW - Capacitance random variable
KW - Probabilistic circuit analysis
KW - RC circuit fault
KW - Voltage prediction
KW - Voltage probability distribution
UR - http://www.scopus.com/inward/record.url?scp=85144379359&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85144379359&partnerID=8YFLogxK
U2 - 10.1016/j.engfailanal.2022.106770
DO - 10.1016/j.engfailanal.2022.106770
M3 - Article
AN - SCOPUS:85144379359
SN - 1350-6307
VL - 142
JO - Engineering Failure Analysis
JF - Engineering Failure Analysis
M1 - 106770
ER -