Probability model of the exponentially rising transient response of a failed RC circuit

Muhammad Farooq-i-Azam, Muhammad Omar Farooq

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number106770
JournalEngineering Failure Analysis
Volume142
DOIs
StatePublished - Dec 2022
Externally publishedYes

ASJC Scopus Subject Areas

  • General Materials Science
  • General Engineering

Keywords

  • Analysis of failed circuit
  • Capacitance random variable
  • Probabilistic circuit analysis
  • RC circuit fault
  • Voltage prediction
  • Voltage probability distribution

Cite this