Pulsed laser cleaning of sub- And micron-size contaminant particles from optical surfaces: Cleaning vs. ablation and damage

Shishir Shukla, Sergey Kudryashov, Kevin Lyon, Susan D. Allen

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Article number59910N
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5991
DOIs
StatePublished - 2005
Externally publishedYes
Event37th Annual Boulder Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials: 2005 - Boulder, CO, United States
Duration: Sep 19 2005Sep 21 2005

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Keywords

  • CO laser
  • Fused silica
  • Glass substrate
  • Isopropanol
  • Sub-micron and micron sized particles

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