Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy

Peter M. Hoffmann; Ahmet Oral; Ralph A. Grimble; H. Özgür Özer; John B. Pethica

doi:10.1063/1.1389785

Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy

Peter M. Hoffmann, Ahmet Oral, Ralph A. Grimble, H. Özgür Özer, John B. Pethica

Research output: Contribution to journal › Article › peer-review

Abstract

Quantitative force gradient images are obtained using a sub-angström amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, and the measured short-range force interaction agrees well in magnitude and length scale with theoretical predictions for single bonds. Atomic resolution is shown to be associated with the presence of a prominent short-range contribution to the total force interaction. It is shown that the background longer-range interaction, whose relative magnitude depends on the tip structure, has a significant effect on the contrast observed at the atomic scale.

Original language	American English
Journal	Applied Physics Letters
DOIs	https://doi.org/10.1063/1.1389785
State	Published - 2001

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Physical Sciences and Mathematics

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abstract = " Quantitative force gradient images are obtained using a sub-angstr{\"o}m amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, and the measured short-range force interaction agrees well in magnitude and length scale with theoretical predictions for single bonds. Atomic resolution is shown to be associated with the presence of a prominent short-range contribution to the total force interaction. It is shown that the background longer-range interaction, whose relative magnitude depends on the tip structure, has a significant effect on the contrast observed at the atomic scale. ",

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AB - Quantitative force gradient images are obtained using a sub-angström amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, and the measured short-range force interaction agrees well in magnitude and length scale with theoretical predictions for single bonds. Atomic resolution is shown to be associated with the presence of a prominent short-range contribution to the total force interaction. It is shown that the background longer-range interaction, whose relative magnitude depends on the tip structure, has a significant effect on the contrast observed at the atomic scale.

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JO - Applied Physics Letters

JF - Applied Physics Letters

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Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy

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