Small-Amplitude Atomic Force Microscopy

Small amplitude Atomic Force Microscopy (AFM) is a relatively new AFM technique which was specifically developed to perform  linear  measurements of nanomechanical phenomena. This is achieved by using ultra-small cantilever amplitudes and very high sensitivity deflection sensors. Recently this technique has been used in ultra-high vacuum (UHV) and liquid environments to measure atomic and molecular forces and dynamics with high precision. Here we focus on three examples which are interesting from a nanoengineering standpoint: Atomic energy dissipation (atomic friction), atomic-scale contact mechanics, and nanotribology/molecular ordering in confined liquid films.