Surface Roughness Analysis System and Methods of Analyzing Surface Roughness of a Workpiece

Shahrooz M. Jahanbin; Jeong-Beom Ihn; Gary E. Georgeson; Nihar Ashokkumar Desai

Surface Roughness Analysis System and Methods of Analyzing Surface Roughness of a Workpiece

Shahrooz M. Jahanbin (Inventor), Jeong-Beom Ihn (Inventor), Gary E. Georgeson (Inventor), Nihar Ashokkumar Desai (Inventor)

Research output: Patent

Abstract

A surface roughness analysis system and methods of analyzing surface roughness of a workpiece are presented .The surface roughness analysis system comprises a number of wave generators ; a number of wave sensors ; and an ultra sonic analysis system configured to receive material mechanical parameters for a workpiece , determine incident surface wave signal parameters for a source signal to be sent by the number of wave generators , and determine a cut - off wavelength using the material mechanical parameters , wherein the cut - off wavelength is a ratio of surface wavelength over incident wavelength.

Original language	American English
State	Published - Mar 1 2022

Access to Document

Surface Roughness Analysis System and Methods of Analyzing Surfac

http://commons.erau.edu/publication/2345

Cite this

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title = "Surface Roughness Analysis System and Methods of Analyzing Surface Roughness of a Workpiece",

abstract = "A surface roughness analysis system and methods of analyzing surface roughness of a workpiece are presented .The surface roughness analysis system comprises a number of wave generators ; a number of wave sensors ; and an ultra sonic analysis system configured to receive material mechanical parameters for a workpiece , determine incident surface wave signal parameters for a source signal to be sent by the number of wave generators , and determine a cut - off wavelength using the material mechanical parameters , wherein the cut - off wavelength is a ratio of surface wavelength over incident wavelength.",

author = "Jahanbin, {Shahrooz M.} and Jeong-Beom Ihn and Georgeson, {Gary E.} and Desai, {Nihar Ashokkumar}",

year = "2022",

month = mar,

day = "1",

language = "American English",

type = "Patent",

}

TY - PAT

T1 - Surface Roughness Analysis System and Methods of Analyzing Surface Roughness of a Workpiece

AU - Jahanbin, Shahrooz M.

AU - Ihn, Jeong-Beom

AU - Georgeson, Gary E.

AU - Desai, Nihar Ashokkumar

PY - 2022/3/1

Y1 - 2022/3/1

N2 - A surface roughness analysis system and methods of analyzing surface roughness of a workpiece are presented .The surface roughness analysis system comprises a number of wave generators ; a number of wave sensors ; and an ultra sonic analysis system configured to receive material mechanical parameters for a workpiece , determine incident surface wave signal parameters for a source signal to be sent by the number of wave generators , and determine a cut - off wavelength using the material mechanical parameters , wherein the cut - off wavelength is a ratio of surface wavelength over incident wavelength.

AB - A surface roughness analysis system and methods of analyzing surface roughness of a workpiece are presented .The surface roughness analysis system comprises a number of wave generators ; a number of wave sensors ; and an ultra sonic analysis system configured to receive material mechanical parameters for a workpiece , determine incident surface wave signal parameters for a source signal to be sent by the number of wave generators , and determine a cut - off wavelength using the material mechanical parameters , wherein the cut - off wavelength is a ratio of surface wavelength over incident wavelength.

M3 - Patent

ER -