Threshold measurements in laser-assisted particle removal (Invited Paper)

Shyan J. Lee, Kamran Imen, Susan D. Allen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsBodil Braren
PublisherPubl by Int Soc for Optical Engineering
Pages2-12
Number of pages11
ISBN (Print)0819407291
StatePublished - 1991
Externally publishedYes
EventLasers in Microelectronic Manufacturing - San Jose, CA, USA
Duration: Sep 10 1991Sep 11 1991

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1598
ISSN (Print)0277-786X

Conference

ConferenceLasers in Microelectronic Manufacturing
CitySan Jose, CA, USA
Period9/10/919/11/91

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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